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On-line study of polyelectrolyte network formation by interfacial reaction

✍ Scribed by Laurent Bourdillon; Christine Wandrey

Book ID
106068225
Publisher
Springer
Year
2004
Weight
726 KB
Volume
282
Category
Article
ISSN
0340-255X

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A 200 nm Ti Ðlm was deposited on a polished AlN ceramic substrate at 200 Γ„C by electron beam evaporation and then annealed under high vacuum conditions. The MCs'-SIMS technique (detecting MCs' secondary ions under Cs' primary ion bombardment, where M is the element to be analysed), RBS and x-ray di