On-line growth control of MOCVD deposited GaN and related ternary compounds via spectroscopic ellipsometry and X-ray diffraction

✍ Scribed by Bonanni, A. ;Schmidegg, K. ;Montagne Ramil, A. ;Kharchenko, A. ;Bethke, J. ;Lischka, K. ;Sitter, H.

• Book ID: 105362695
• Publisher: John Wiley and Sons
• Year: 2004
• Tongue: English
• Weight: 226 KB
• Volume: 201
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/pssa.200404805