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On-chip testing of embedded p.l.a.s. : P. Warma, A. P. Ambler and K. Baker. J. Instn Electron. Radio Engrs55 (9) 306 (1985)

Book ID: 103279971
Publisher: Elsevier Science
Year: 1986
Tongue: English
Weight: 133 KB
Volume: 26
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(86)90053-3

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