Functional testing of LSI/VLSI chips—a survey : P. K. Lala and N. Berenjian. J. Instn Electron. Radio Engrs57(6), 255 (November/December 1987)

• Book ID: 103286440
• Publisher: Elsevier Science
• Year: 1989
• Tongue: English
• Weight: 103 KB
• Volume: 29
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(89)90357-0