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On Bayesian reliability analysis with informative priors and censoring

โœ Scribed by F.P.A. Coolen

Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
748 KB
Volume
53
Category
Article
ISSN
0951-8320

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This paper examines Bayesian analysis as a tool for predicting both reliability growth and reliability of censored multi-level, multi-stress accelerated life tests. The methodology is examined using the Dirichlet prior distribution in reliability growth applications and in randomly ordered accelerat