✦ LIBER ✦
Bayesian reliability analysis using the Dirichlet prior distribution with emphasis on accelerated life testing run in random order
✍ Scribed by Ian F. Somerville; Duane L. Dietrich; Thomas A. Mazzuchi
- Publisher
- Elsevier Science
- Year
- 1997
- Tongue
- English
- Weight
- 632 KB
- Volume
- 30
- Category
- Article
- ISSN
- 0362-546X
No coin nor oath required. For personal study only.
✦ Synopsis
This paper examines Bayesian analysis as a tool for predicting both reliability growth and reliability of censored multi-level, multi-stress accelerated life tests. The methodology is examined using the Dirichlet prior distribution in reliability growth applications and in randomly ordered accelerated life tests occurring iu designed experiments (DOE). A simulation is used to examine the utility and accuracy of the approach both graphically and statistically.
The results are both enlightening and conclusive.