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Ohmic contact formation mechanism of Ni on n-type 4H–SiC

✍ Scribed by S. Y. Han; K. H. Kim; J. K. Kim; H. W. Jang; K. H. Lee; N. Kim; E. D. Kim; J. Lee


Book ID
126682704
Publisher
American Institute of Physics
Year
2001
Tongue
English
Weight
335 KB
Volume
79
Category
Article
ISSN
0003-6951

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