Occurrence of Both Unipolar Memory and Threshold Resistance Switching in a NiO Film

✍ Scribed by Chang, S. H.; Lee, J. S.; Chae, S. C.; Lee, S. B.; Liu, C.; Kahng, B.; Kim, D.-W.; Noh, T. W.

• Book ID: 126683226
• Publisher: The American Physical Society
• Year: 2009
• Tongue: English
• Weight: 321 KB
• Volume: 102
• Category: Article
• ISSN: 0031-9007
• DOI: 10.1103/PhysRevLett.102.026801