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Obtaining Low Orders of Interference in Measuring Film Thicknesses by Multiple Beam Interferometry

✍ Scribed by SCOTT, G. DAVID

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

175. Obtaining low orders of interferenc

📂 Article 📅 1959 🏛 Elsevier Science 🌐 English ⚖ 123 KB

Thickness measurements of thin films by

📂 Article 📅 1954 🏛 Elsevier Science 🌐 English ⚖ 79 KB

The thickness measurement of thin films

📂 Article 📅 1951 🏛 Elsevier Science 🌐 English ⚖ 111 KB

Errors in the Measurement of Film Thickn

✍ WEAVER, C.; BENJAMIN, P. 📂 Article 📅 1958 🏛 Nature Publishing Group 🌐 English ⚖ 197 KB

Measurement of the Thickness of Thin Fil

✍ WEAVER, C.; BENJAMIN, P. 📂 Article 📅 1956 🏛 Nature Publishing Group 🌐 English ⚖ 221 KB

Measurement of the thickness of thin fil

📂 Article 📅 1956 🏛 Elsevier Science 🌐 English ⚖ 121 KB