175. Obtaining low orders of interference in measuring film thicknesses by multiple beam interferometry: G. David Scott, J. Opt. Soc. Amer.48, No. 11, 858, Nov. 1958

• Book ID: 103443430
• Publisher: Elsevier Science
• Year: 1959
• Tongue: English
• Weight: 123 KB
• Volume: 9
• Category: Article
• ISSN: 0042-207X
• DOI: 10.1016/0042-207x(59)90241-6