Observed failure rates of electronic components in computer systems : Peter Lucas and Lorin Knight. Microelectron. and Reliab.15, 239 (1976)

• Publisher: Elsevier Science
• Year: 1976
• Tongue: English
• Weight: 134 KB
• Volume: 15
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(76)90488-1