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Observed failure rates of electronic components in computer systems

โœ Scribed by Peter Lucas; Lorin Knight


Publisher
Elsevier Science
Year
1976
Tongue
English
Weight
294 KB
Volume
15
Category
Article
ISSN
0026-2714

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The maximum likelihood estimator (MLE) for a distribution function with increasing failure rate is derived, based on a collection of series system data. Applications can arise in industries where operating environments make available only such system-level data, due to system configuration or type-I