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Observations on the solid system CuCl2-KCl in the temperature range 293–673 K

✍ Scribed by K. Zurowski

Publisher
Springer Netherlands
Year
1992
Tongue
English
Weight
315 KB
Volume
38
Category
Article
ISSN
0022-5215

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## Abstract The temperature dependence of the Debye‐Waller factors of vanadium and silicon in V~3~Si and that of the X‐ray Debye temperature are obtained from the integral intensities of X‐ray reflection measured at 11 temperatures ranging from 8 K to 293 K. It shown that the breaks on these curves