Observation of surface and bulk plasmons in semiconductor superlattices

✍ Scribed by T. Dumelow; A.A. Hamilton; T.J. Parker; D.R. Tilley; B. Samson; S.R.P. Smith; R.B. Beall; J.J. Harris

• Publisher: Elsevier Science
• Year: 1991
• Tongue: English
• Weight: 267 KB
• Volume: 9
• Category: Article
• ISSN: 0749-6036
• DOI: 10.1016/0749-6036(91)90182-q

✦ Synopsis

We report far infrared measurements of oblique incidence power reflectivity and attenuated total reflection (ATR) on multiply Si 5--doped GaAs samples. The reflectivity spectrum in s-polarisation probes the in-plane component of the superlattice dielectric function, and is sensitive to the overall 3D electron density. The p-polarisation spectrum, however, also probes the out-of-plane component, resulting in an extra mode which is sensitive to the distribution of free electrons between wells and barriers. The p-polarisation ATR spectrum shows surface modes which are also sensitive to this distribution. The results are compared with a bulk slab model of the dielectric function.