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Observation of planar defects by reflection electron microscopy

✍ Scribed by Feng Tsai; J.M. Cowley

Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
282 KB
Volume
52
Category
Article
ISSN
0304-3991

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Reflection electron holography is described as a method to observe sub-A surface morphology. Phase shift of a Bragg-reflected electron wave was measured by means of holographic interferometry using an electron microscope equipped with a field emission electron gun and an electron biprism. A short wa