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Observation of Lattice Plane Bending during SiC PVT Bulk Growth Using In Situ High Energy X-Ray Diffraction

✍ Scribed by Hock, Rainer; Konias, Katja; Perdicaro, L.; Magerl, Andreas; Hens, Philip; Wellmann, Peter J.

Book ID: 121232400
Publisher: Trans Tech Publications, Ltd.
Year: 2010
Tongue: English
Weight: 459 KB
Volume: 645-648
Category: Article
ISSN: 1662-9752
DOI: 10.4028/www.scientific.net/MSF.645-648.29

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