Application of 3-D X-Ray Computed Tomography for the In Situ Visualization of the SiC Crystal Growth Interface during PVT Bulk Growth

✍ Scribed by Neubauer, Georg; Salamon, Michael; Roider, Florian; Uhlmann, Norman; Wellmann, Peter J.

• Book ID: 120827127
• Publisher: Trans Tech Publications, Ltd.
• Year: 2013
• Tongue: English
• Weight: 528 KB
• Volume: 740-742
• Category: Article
• ISSN: 1662-9752
• DOI: 10.4028/www.scientific.net/MSF.740-742.27