Observation of latch-up time evolution in CMOS IC's by means of SEM stroboscopic voltage contrast techniques

✍ Scribed by Zanoni, E.; Giannini, M.; Senin, A.; Simeone, G.; Canali, C.

• Book ID: 119798668
• Publisher: IEEE
• Year: 1987
• Tongue: English
• Weight: 905 KB
• Volume: 22
• Category: Article
• ISSN: 0018-9200
• DOI: 10.1109/jssc.1987.1052672