Observation of latch-up phenomena in CMOS ICs by means of digital differential voltage contrast

✍ Scribed by Fantini, F.; Vanzi, M.; Morandi, C.; Zanoni, E.

• Book ID: 119798540
• Publisher: IEEE
• Year: 1986
• Tongue: English
• Weight: 887 KB
• Volume: 21
• Category: Article
• ISSN: 0018-9200
• DOI: 10.1109/jssc.1986.1052494