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Observation of discrete energy levels of interface traps in sub-μm MOSFETs

✍ Scribed by G.R. Siegert; P. Vitanov; I. Eisele

Publisher: Elsevier Science
Year: 1994
Tongue: English
Weight: 862 KB
Volume: 37
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(94)90170-8

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