Numerical Simulation of Bottom Oxide Thickness Effect on Charge Retention in SONOS Flash Memory Cells

✍ Scribed by Gu, S.-H.; Hsu, C.-W.; Wang, T.; Lu, W.-P.; Ku, Y.-H. J.; Lu, C.-Y.

• Book ID: 114618552
• Publisher: IEEE
• Year: 2007
• Tongue: English
• Weight: 804 KB
• Volume: 54
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2006.887219