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Numerical analysis of normal reflectance data as applied to the study of oxide films on copper

✍ Scribed by K Bärwinkel; H.J Schmidt

Book ID: 107862682
Publisher: Elsevier Science
Year: 1979
Tongue: English
Weight: 508 KB
Volume: 59
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(79)90447-4

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