Numerical analysis of deep-trap behaviors on retention time distribution of DRAMs with negative wordline bias

✍ Scribed by Jeong-Hyong Yi; Sung-Kye Park; Park, Y.-J.; Hong Shick Min

• Book ID: 114617748
• Publisher: IEEE
• Year: 2005
• Tongue: English
• Weight: 548 KB
• Volume: 52
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2005.845151