## Abstract In this paper, we present a model for double heterojunction bipolar transistors (DHBTs) that takes into account FermiβDirac statistics as well as an arbitrary injection level. The most commonly used models in the literature for heterojunction bipolar transistors (HBTs), bipolar junction
Numerical analysis of abrupt heterojunction bipolar transistors
β Scribed by Antonio J. Garcia-Loureiro; Juan M. Lopez-Gonzalez; Tomas F. Pena; Lluis Prat
- Publisher
- John Wiley and Sons
- Year
- 1998
- Tongue
- English
- Weight
- 99 KB
- Volume
- 11
- Category
- Article
- ISSN
- 0894-3370
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β¦ Synopsis
This paper presents a physical-mathematical model for abrupt heterojunction transistors and its solution using numerical methods with application to InP/InGaAs HBTs. The physical model is based on the combination of the drift-diffusion transport model in the bulk with thermionic emission and tunnelling transmission through the emitter-base interface. Fermi-Dirac statistics and bandgap narrowing distribution between the valence and conduction bands are considered in the model. A compact formulation is used that makes it easy to take into account other effects such as the non-parabolic nature of the bands or the presence of various subbands in the conduction process. The simulator has been implemented for distributed memory multicomputers, making use of the MPI message-passing standard library. In order to accelerate the solution process of the linear system, iterative methods with parallel incomplete factorization-based preconditioners have been used.
π SIMILAR VOLUMES
A model of heat transfer in a SiGe heterojunction bipolar transistor (HBT) at the macro scale is established, that leads to an analytical solution. Modelling is based on the use of integral transforms as the Fourier and Laplace ones. The heat source is assumed as a heat flux applied at the base-coll