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Novel tip modification method for measurement of the adhesive force between a silanized surface and a locally modified tip using atomic force microscopy

✍ Scribed by Han, Seung Pil; Suga, Kosaku; Fujihira, Masamichi; Park, Byung-Eun

Book ID: 121571992
Publisher: The Korean Physical Society
Year: 2014
Tongue: English
Weight: 289 KB
Volume: 64
Category: Article
ISSN: 0374-4884
DOI: 10.3938/jkps.64.63

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