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Measuring the sizes of nanospheres on a rough surface by using atomic force microscopy and a curvature–reconstruction method

✍ Scribed by Koudai Oikawa; Hyonchol Kim; Naoya Watanabe; Masatsugu Shigeno; Yoshiharu Shirakawabe; Kenji Yasuda

Book ID: 108291718
Publisher: Elsevier Science
Year: 2007
Tongue: English
Weight: 658 KB
Volume: 107
Category: Article
ISSN: 0304-3991
DOI: 10.1016/j.ultramic.2007.03.011

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