𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Novel non-destructive X-ray technique for near-real time defect mapping : Anathanarayanan, T.S.; Rosemeier, R.G.; Mayo, W.E.; Sacks, S. Nondestructive Characterisation of Materials 2, Montreal (Canada), 21–23 Jul, 1986. pp. 657–666. Edited by J.F. Bussiere, J.P. Monchalin, C.O. Ruud, R.E. Green Jr. Plenum Press, 1987


Publisher
Elsevier Science
Year
1990
Weight
170 KB
Volume
23
Category
Article
ISSN
0308-9126

No coin nor oath required. For personal study only.


📜 SIMILAR VOLUMES