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Nonlinear refraction in nanocrystalline silicon carbide films

โœ Scribed by A. A. Borshch; M. S. Brodyn; V. I. Volkov; V. I. Rudenko; V. R. Lyakhovetskii; V. A. Semenov; V. M. Puzikov


Book ID
110168917
Publisher
SP MAIK Nauka/Interperiodica
Year
2008
Tongue
English
Weight
197 KB
Volume
88
Category
Article
ISSN
0021-3640

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Nanocrystalline silicon carbide (nc-SiC) thin films have been grown on silicon (1 0 0) substrates by helicon wave plasma enhanced chemical vapor deposition technique and the photoluminescence of the films has been tuned from yellow to blue by changing the substrate temperatures (T s ). The resulting