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Nonlinear cyclotron-impurity resonance in semiconductors

โœ Scribed by V. A. Margulis


Book ID
110140199
Publisher
Springer
Year
2004
Tongue
English
Weight
91 KB
Volume
99
Category
Article
ISSN
1063-7761

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The experimental details of the cyclotron resonance experiments by which the effective masses of charge carriers in semiconductors have been determined are discussed. The semiconductors are measured at low temperatures to allow largest possible mean free path for the charge carriers. 1 cm microwave