Experimental work on cyclotron resonance in semiconductors

✍ Scribed by A.F. Kip

• Book ID: 104162133
• Publisher: Elsevier Science
• Year: 1954
• Weight: 247 KB
• Volume: 20
• Category: Article
• ISSN: 0031-8914
• DOI: 10.1016/s0031-8914(54)80193-5

✦ Synopsis

The experimental details of the cyclotron resonance experiments by which the effective masses of charge carriers in semiconductors have been determined are discussed. The semiconductors are measured at low temperatures to allow largest possible mean free path for the charge carriers. 1 cm microwave equipment is used. Charge carriers can be produced in some cases by radio frequency ionization in the semiconductor samples. Circularly polarized microwaves resonating in a circular cylindrical cavity are used in the determination of the sign of the charge carriers. The microwave equivalent of a quarter wave plate is used in the production of the circularly polarized microwaves. EXPERIMENTAL WORK ON CYCLOTRON RESONANCE IN SEMICONDUCTORS 817 Westinghouse for samples of the semiconductors used in these experiments.