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Noninvasive measurement of dielectric properties in layered structure: A system identification approach

โœ Scribed by R.M. Irastorza; M. Mayosky; F. Vericat


Publisher
Elsevier Science
Year
2009
Tongue
English
Weight
318 KB
Volume
42
Category
Article
ISSN
0263-2241

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Dielectric Relaxation on the Intermediat
โœ Toshihisa Osaki; Akihiko Tanioka ๐Ÿ“‚ Article ๐Ÿ“… 2002 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 158 KB

In this study, we examined the dielectric properties of an intermediate layer in a bipolar membrane, which is composed of a negatively charged layer and a positively charged layer joined in series. As a result of the time-dependent impedance measurements of charged membranes, the negative increment