✦ LIBER ✦
1199. Investigation of the CdSe-SiOx system properties by the MIS structure capacitance measurement method: A Jakubowksi and P Jagodzinki, Elektronika, 12 (7), 1971, 261–267 (in Polish)
- Publisher
- Elsevier Science
- Year
- 1972
- Tongue
- English
- Weight
- 134 KB
- Volume
- 22
- Category
- Article
- ISSN
- 0042-207X
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