Nondestructive Evaluation of Materials by Infrared Thermography

✍ Scribed by Professor Xavier P. V. Maldague PhD (auth.)

• Publisher: Springer-Verlag London
• Year: 1993
• Tongue: English
• Leaves: 230
• Edition: 1
• Category: Library

✦ Synopsis

With national trade barriers falling, causing the expansion of the com­ petitive global market, the question of quality control has become an essential issue for the 1990s. The time where the promise was to replace a product if it does not work seems to have passed; what is more impor­ tant now is not so much a reduction in what is going wrong but an increase of what is going right the first time (Feigenbaum 1990). This new trend is sometimes referred to as total quality. Among the many advantages ofthis zero-defect manufacturing policy, we can enumerate (Laurin 1990): superior marketability of wholly de­ pendable products, enormous gain in productivity, elimination of waste­ ful cost in replacing poor quality work and retrofitting rejected products from the field. Although total quality is a relatively new and attractive concept for mass products such as cars, consumer electronics and per­ sonal computers, in many fields, mainly aerospace and military, it has been the rule for years because of security reasons.

✦ Table of Contents

Front Matter....Pages i-xxxii
Overview of Nondestructive Evaluation (NDE) Using Infrared Thermography....Pages 1-22
Theoretical Aspects....Pages 23-37
Experimental Apparatus....Pages 39-72
External Thermal Stimulation: Methods and Image Processing....Pages 73-99
Internal Thermal Stimulation: Methods and Image Processing....Pages 101-112
Quantitative Analysis of Delaminations....Pages 113-138
Inspection of Materials with Low Emissivity by Thermal Transfer Imaging....Pages 139-147
Thermal Diffusivity Measurements of Materials....Pages 149-155
Thermal Tomography....Pages 157-164
Thermal NDE of Nonplanar Surfaces....Pages 165-170
Applications of Infrared Thermography to High Temperatures....Pages 171-176
Back Matter....Pages 177-207

✦ Subjects

Electronics and Microelectronics, Instrumentation; Characterization and Evaluation of Materials; Condensed Matter Physics