✦ LIBER ✦

Nondestructive characterization of SIMOX structures

✍ Scribed by R.M. Geatches; K.J. Reason; A.J. Griddle; R.P. Webb; P.J. Pearson; P.L.F. Hemment; A. Nejim

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Raman characterization of SOI-SIMOX stru

✍ E. Martin; J. Jiménez; A. Pérez-Rodrígues; J.R. Morante 📂 Article 📅 1992 🏛 Elsevier Science 🌐 English ⚖ 486 KB

Nondestructive assessment of SIMOX subst

✍ E.F. Steigmeier; G. Harbeke; K.J. Reeson; P.L.F. Hemment; A.K. Robinson 📂 Article 📅 1989 🏛 Elsevier Science 🌐 English ⚖ 379 KB

Electrical characterization of thin film

✍ Zhu Wenhua; Lin Chenglu; Shi Zuoyu; Zou Shichang; P.L.F. Hemment; A. Nejim 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 326 KB

Characterization of SOI-SIMOX structures

✍ G. Ghislotti; A. Gagliardi; C.E. Bottani; S. Bertoni; G.F. Cerofolini; L. Meda 📂 Article 📅 1996 🏛 Elsevier Science 🌐 English ⚖ 325 KB

Optical characterization of doped SIMOX

✍ C.C. Katsidis; D.I. Siapkas; D. Panknin; N. Hatzopoulos; W. Skorupa 📂 Article 📅 1995 🏛 Elsevier Science 🌐 English ⚖ 303 KB

Non-destructive characterization of thin

✍ Alan J. Criddle; Peter J. Pearson; Karen J. Reeson; Amarjit K. Robinson; Peter L 📂 Article 📅 1992 🏛 Elsevier Science 🌐 English ⚖ 630 KB