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Non-Destructive Thickness Measurement Using Quasi-Static Resonators

โœ Scribed by Boybay, Muhammed S.; Ramahi, Omar M.


Book ID
120089696
Publisher
IEEE
Year
2013
Tongue
English
Weight
546 KB
Volume
23
Category
Article
ISSN
1531-1309

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Non-destructive thickness measurement of
โœ R.P. Shukla; D.V. Udupa; N.C. Das; Murty V. Mantravadi ๐Ÿ“‚ Article ๐Ÿ“… 2006 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 655 KB

A quick estimation of the thickness of thin films deposited on glass plates is described in this paper. The principle of the method is based on the measurement of the Haidinger fringes generated by the film. For ease of observation and measurement, a commercial Fizeau-type interferometer such as a Z