Non-destructive statistical analysis of embedded nanoparticles by X-ray diffraction imaging

✍ Scribed by D. Pelliccia; A.Y. Nikulin; B.C. Muddle; O. Sakata

• Book ID: 113898834
• Publisher: Elsevier Science
• Year: 2011
• Tongue: English
• Weight: 375 KB
• Volume: 64
• Category: Article
• ISSN: 1359-6462
• DOI: 10.1016/j.scriptamat.2010.12.001