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Non-destructive evaluation of multilayer conductor using an HTS SQUID gradiometer

โœ Scribed by J. Kawano; T. Hato; S. Adachi; Y. Oshikubo; A. Tsukamoto; K. Tanabe


Publisher
Elsevier Science
Year
2010
Tongue
English
Weight
307 KB
Volume
470
Category
Article
ISSN
0921-4534

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Non-destructive evaluation of semiconduc
โœ Koichi Kojima; Sachio Suda; Xiangyan Kong; Hideo Itozaki ๐Ÿ“‚ Article ๐Ÿ“… 2006 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 217 KB

A laser SQUID microscope has become a new tool for non-destructive evaluation of semiconductors. To improve the spatial resolution, a flux guide was introduced in the laser SQUID microscope. Using our laser SQUID microscope with and without the flux guide we have measured the magnetic field distribu