Non-Destructive Evaluation of Deep-Lying Defects in Multilayer Conductors Using HTS SQUID Gradiometer

✍ Scribed by Kawano, J.; Hato, T.; Adachi, S.; Oshikubo, Y.; Tsukamoto, A.; Tanabe, K.

• Book ID: 118178924
• Publisher: IEEE
• Year: 2011
• Tongue: English
• Weight: 534 KB
• Volume: 21
• Category: Article
• ISSN: 1051-8223
• DOI: 10.1109/tasc.2010.2090852