Non-destructive determination of carrier concentration in epitaxial silicon using a total internal reflection technique

✍ Scribed by Dinesh C. Gupta

• Publisher: Elsevier Science
• Year: 1970
• Tongue: English
• Weight: 693 KB
• Volume: 13
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(70)90135-8