Non-destructive determination of carrier concentration in epitaxial silicon using a total internal reflection technique : D. C. Gupta, Solid-St. Electron. 13 (1970), p. 543

• Publisher: Elsevier Science
• Year: 1970
• Tongue: English
• Weight: 108 KB
• Volume: 9
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(70)90201-5