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Non-destructive depth profile analysis using synchrotron radiation excited XPS

✍ Scribed by Zier, Michael ;Oswald, Steffen ;Reiche, Rainer ;Wetzig, Klaus

Publisher: Springer-Verlag
Year: 2006
Weight: 145 KB
Volume: 156
Category: Article
ISSN: 0344-838X
DOI: 10.1007/s00604-006-0615-9

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