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Non destructive analysis of SiC wafers

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Non-destructive characterisation of SOI

✍ P. Smeys; U. Magnusson; J.P. Colinge 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 306 KB

Non-destructive determination of residua

✍ A.T. Andonian; S. Danyluk 📂 Article 📅 1984 🏛 Elsevier Science 🌐 English ⚖ 436 KB

Development of non-destructive bulk micr

✍ Moriya, K.; Wada, H.; Hirai, K. 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 819 KB

Non-destructive XRF analysis of painting

✍ Z. Szökefalvi-Nagy; I. Demeter; A. Kocsonya; I. Kovács 📂 Article 📅 2004 🏛 Elsevier Science 🌐 English ⚖ 425 KB

Rapid non-destructive analysis of ancien

✍ R. Cesareo; F. Frazzoli; C. Mancini; S. Sciuti; M. Marabelli 📂 Article 📅 1972 🏛 Elsevier Science ⚖ 210 KB

The non-destructive analysis of ancient

✍ H. A. Das; J. Zonderhuis 📂 Article 📅 2010 🏛 Elsevier Science 🌐 English ⚖ 214 KB