๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Noise sources in silicon on insulator (SIMOX) MOSFET's

โœ Scribed by T. Elewa; B. Boukriss; H. Haddara; A. Chovet; S. Cristoloveanu


Publisher
Elsevier Science
Year
1990
Tongue
English
Weight
453 KB
Volume
8
Category
Article
ISSN
0749-6036

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES


Interface coupling effects in thin silic
โœ T. Ouisse; S. Cristoloveanu; T. Elewa; B. Boukriss; A. Chovet ๐Ÿ“‚ Article ๐Ÿ“… 1990 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 526 KB

Several experiments converge to demonstrate the strong variation of the front channel properties with the substrate bias in thin film SOI-MOS structures. A model is proposed 'to explain the deformation of the transconductance shape and the variation of its maximum. A related second order effect cons