✦ LIBER ✦
Back-gate induced random telegraph signal noise in fully-depleted silicon-on-insulator nMOSFETs
✍ Scribed by E. Simoen; U. Magnusson; J. Vermeiren; C. Claeys
- Publisher
- Elsevier Science
- Year
- 1993
- Tongue
- English
- Weight
- 275 KB
- Volume
- 36
- Category
- Article
- ISSN
- 0038-1101
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