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Noise modeling in submicrometer-gate FET's

โœ Scribed by Carnez, B.; Cappy, A.; Fauquembergue, R.; Constant, E.; Salmer, G.


Book ID
114593801
Publisher
IEEE
Year
1981
Tongue
English
Weight
588 KB
Volume
28
Category
Article
ISSN
0018-9383

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