✦ LIBER ✦
Analytical noise model with the influence of shot noise induced by the gate leakage current for submicrometer gate-length high-electron-mobility transistors
✍ Scribed by Doo-Sik Shin; Lee, J.B.; Hong Shick Min; Jae-Eung Oh; Young June Park; Woong Jung; Dong Sung Ma
- Book ID
- 114537029
- Publisher
- IEEE
- Year
- 1997
- Tongue
- English
- Weight
- 173 KB
- Volume
- 44
- Category
- Article
- ISSN
- 0018-9383
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