Noise measurement analysis of NPN transistors after gamma irradiation—An investigation for reliability

✍ Scribed by S.K Khobare

• Book ID: 103281011
• Publisher: Elsevier Science
• Year: 1981
• Tongue: English
• Weight: 201 KB
• Volume: 21
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(81)90392-9