✦ LIBER ✦
An investigation of device reliability for a micro-machined AlGaN/GaN/Si high electron mobility transistor using low frequency noise measurement
✍ Scribed by Chiu, Hsien-Chin; Wang, Hsiang-Chun; Wu, Chia-Hsuan; Huang, Fan-Hsiu; Kao, Hsuan-Ling; Chien, Feng-Tso
- Book ID
- 122321648
- Publisher
- Elsevier Science
- Year
- 2014
- Tongue
- English
- Weight
- 838 KB
- Volume
- 114
- Category
- Article
- ISSN
- 0167-9317
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