Noise degradation induced by γ-rays on P- and N-channel junction field-effect transistors

✍ Scribed by Manfredi, P.F.; Ratti, L.; Re, V.; Speziali, V.

• Book ID: 114554924
• Publisher: IEEE
• Year: 1999
• Tongue: English
• Weight: 162 KB
• Volume: 46
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/23.795806