Noise Characterization of Double-Sided Silicon Microstrip Detectors With Punch-Through Biasing

✍ Scribed by Giacomini, G.; Bosisio, L.; Rashevskaya, I.; Starodubtsev, O.

• Book ID: 114663807
• Publisher: IEEE
• Year: 2011
• Tongue: English
• Weight: 314 KB
• Volume: 58
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/tns.2011.2107749